Catalog item
Request a quoteSEMICONDUCTOR DEVICE,TEST SYSTEM
5961FSC
00NCB code
945-1957Item number
NIIN 00-945-1957
- DEMIL code
- A
Identification
- Item name code
- 77777
- PINC
- 1520347
- Criticality code
- X
- II
- N
- DEMIL code
- A
- NIIN assigned
- 01-APR-66
- Precious metals indicator
- U
- Hazardous material indicator
- N
- Last known source of supply
- N35
Part numbers
Characteristics
| REFERENCE NUMBER DIFFERENTIATING CHARACTERISTICS | SELECTED AND TESTED FOR POLARIS MISSILE SYSTEM |
|---|
MOE rules
| MOE rule | MOE CD | Date assigned | PICA | PICA LOA | Auth collab |
|---|---|---|---|---|---|
| ZR01 | ZR | 01-APR-91 | ZR | 81 | ZR |
| ZT01 | ZT | 01-APR-91 | ZT | 81 | ZT |
| ZU01 | ZU | 01-APR-91 | ZU | 81 | ZU |
| ZX01 | ZX | 01-APR-91 | ZX | 81 | |
| ZW01 | ZW | 01-APR-91 | ZW | 81 | ZW |
Freight
- ACTY CD
- HD
Related items
Standardization
- Item standardization code
- C
- Orig stdzn dec
- TX
- Dt stdzn dec
- 24-JUN-1972
- NIIN status code
- 0
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