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Catalog item

MICROCIRCUIT,DIGITAL

5962FSC

01NCB code

022-4664Item number

NIIN 01-022-4664

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DEMIL code: Q

Identification

Item name code: 31779
PINC: 0031779
Criticality code: X
II: 0
DEMIL code: Q
NIIN assigned: 29-MAY-76
Precious metals indicator: U
Hazardous material indicator: N
ESD/EMI code: B
Schedule B export code: 8542900000
Last known source of supply: S9E

Part numbers

Part number	CAGE	CAGE status	RNCC	RNVC	Document availability code	RNAAC	RNFC	RNSC	SADC
3008509-045-1	99696 LOCKHEED MARTIN CORPORATION DIV LOCKHEED MARTIN SYSTEMS & GLOBAL SOLUTIONS	A	3	2	2	SB	1	A
SNJ5495AJA	D6528 LACON ELECTRONIC GMBH	A	C	1	9	ZZ	4	D	9F
SNJ5495AJA	C7191 ADELCO ELEKTRONIK GMBH	R	5	9	9	ZG	4	B
SNJ5495AJ	01295 TEXAS INSTRUMENTS INCORPORATED	A	5	1	E	TX

Characteristics

BODY LENGTH	INCHES MINIMUM 0.755 AND INCHES MAXIMUM 0.785
BODY WIDTH	INCHES MAXIMUM 0.280
BODY HEIGHT	INCHES NOMINAL 0.180
OPERATING TEMP RANGE	CELSIUS -55.0 TO 125.0
STORAGE TEMP RANGE	CELSIUS -65.0 TO 150.0
FEATURES PROVIDED	HERMETICALLY SEALED AND W/CLOCK AND POSITIVE OUTPUTS
INCLOSURE MATERIAL	CERAMIC AND GLASS
INCLOSURE CONFIGURATION	DUAL-IN-LINE
OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC
INPUT CIRCUIT PATTERN	8 INPUT
DESIGN FUNCTION AND QUANTITY	SHIFT REGISTER, PARALLEL ACCESS 1
TIME RATING PER CHACTERISTIC	NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT 27.00 AND NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT 32.00
TEST DATA DOCUMENT	STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). 96906--IL-STD-883

MOE rules

MOE rule	MOE CD	Date assigned	PICA	PICA LOA	Auth collab
ZH01	ZH	01-APR-91	ZH	81	ZH
ZW01	ZW	01-DEC-95	ZW	81	ZW

Freight

ACTY CD: SU

Related items

Standardization

Item standardization code: 3
Orig stdzn dec: TX
Dt stdzn dec: 31-AUG-1994
NIIN status code: 0

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