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Catalog item

TEST SET,SEMICONDUCTOR DEVICE

6625FSC

01NCB code

419-8132Item number

NIIN 01-419-8132

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DEMIL code: A

Identification

Item name code: 25006
PINC: 0025006
Criticality code: X
II: M
DEMIL code: A
DEMIL integrity code: 1
NIIN assigned: 29-SEP-95
Precious metals indicator: A
ADP equipment code: 0
Hazardous material indicator: P
Schedule B export code: 9030908030
Last known source of supply: XZZ

Part numbers

Part number	CAGE	CAGE status	RNCC	RNVC	Document availability code	RNAAC
370A-1P	1T110 DATAWARE ELECTRONICS CORP SUB OF DATAWARE SYSTEMS LEASE INC	A	3	2	4	ZZ
370-1P	1T110 DATAWARE ELECTRONICS CORP SUB OF DATAWARE SYSTEMS LEASE INC	A	5	2	4	ZZ
370A-1P	80009 TEKTRONIX, INC.	A	5	1	4	ZZ

Characteristics

END ITEM IDENTIFICATION	COMMON TEST EQUIPMENT
ENCLOSURE FEATURE	MULTIPLE ITEM W/HOUSING
TEST TYPE FOR WHICH DESIGNED	PARAMETER CHARACTIZATION OF SEMICONDUCTOR DEVICES
PURCHASE DESCRIPTION IDENTIFICATION	1T110CONTRACT/F41608-94-C-0785

MOE rules

MOE rule: ZH01
MOE CD: ZH
Date assigned: 01-AUG-98
PICA: ZH
PICA LOA: 81
Auth collab: ZH

Freight

ACTY CD: TK

Related items

Standardization

Item standardization code: 5
Orig stdzn dec: 97
Dt stdzn dec: 29-SEP-1995
NIIN status code: 0

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